Abstract
Eight genotypes of wheat with Chakwal-50 (control) were crossed by using Line X Tester analysis to study the spike traits
under moisture stress conditions. The results revealed significant differences among lines and testers for most of the traits
under stress. The parental lines i.e. Chakwal-50, GD-159 and GD-171 and crosses, i.e. GD-170 x GD-159 and GD-153 x
GD-171 were found to be the most resistant to moisture stress. The parent GD-153 remained best for spikelets per spike,
grain yield per plant, spike density and GD-171 for spike length, while GD-102 for maximum awn length and grains per
spike. Whereas, the cross GD-170 x GD-159 was found to be the best for increased spike length and the crosses GD-170 x
GD-159, GD-170 x GD-189, GD-153 x GD-171 for yield and yield components. These superior genotypes and crosses can
be used to develop new varieties for irrigated as well as barani areas.
