Abstract
A 4 x 4 diallel cross experiment involving four wheat varieties/lines viz., Faisalabad 85, Pitic-62, 4072 and 6128-2 revealed that plant parameters like flag leaf area, spike length and number of grains per spike were controlled by partial dominance type of gene action. While number of spikelets per spike, grain yield per plant were controlled by over-dominance type of gene action. Epistasis was observed for grain yield per plant.
