Abstract
Fifteen wheat varieties/lines were sown under greenhouse and in normal field conditions. Phenotypic and genotypic correlations among the seedling traits, some mature plant attributes, protein contents and grain yield planr ! were estimated. Direct and indirect effects of these traits on grain yield were determined through path-coefficient analysis. Survival rate, total leaf area and leaf area index had positive but non-significant genotypic as welI as phenotypic correlation with grain yield whereas epidermal cell size, nag leaf area and protein contents had negative but non-significant correlation with yield. Path-coefficient determined that leaf area index and epidermal cell size are the characters which contribute largely to grain yield.

Khurshid Alam, M. Aslam Chowdhry, Ihsan Khaliq. (1993) CORRELATION AND PATH-COEFFICIENT OF STRESS RELATED TRAITS IN SPRING WHEAT, , Volume 30, Issue 1.
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